Scanning Electron Microscopy (SEM)
The scanning electron microscope is used to perform fractographic, topographic and analytical examinations. The images are displayed simultaneously via the secondary electron (SE) and back-scattered electron (BSE) detectors. We use energy-dispersive micro-area analysis (EDX) for the qualitative and semi-quantitative detection of the elementary composition of the materials to be examined, including phases, foreign matter and non-metallic inclusions (NME). The results are displayed in graphs and tables or as spatially resolved images using the mapping function.
- Detection of microscopic fracture characteristics
- Microstructure analyses
- Determination of fracture origin areas
- Fracture propagation analyses
- Detection of fracture parameters
- Detection of foreign phases (inclusions, impurities)
- Detection of defects
- Particle analyses
- Energy-dispersive micro-area analysis
- 3D display
- Colour coding of details