Scanning Electron Microscopy (SEM)

The scanning electron microscope is used to perform fractographic, topographic and analytical examinations. The images are displayed simultaneously via the secondary electron (SE) and back-scattered electron (BSE) detectors. We use energy-dispersive micro-area analysis (EDX) for the qualitative and semi-quantitative detection of the elementary composition of the materials to be examined, including phases, foreign matter and non-metallic inclusions (NME). The results are displayed in graphs and tables or as spatially resolved images using the mapping function.
 

  • Detection of microscopic fracture characteristics
  • Microstructure analyses
  • Determination of fracture origin areas
  • Fracture propagation analyses
  • Detection of fracture parameters
  • Detection of foreign phases (inclusions, impurities)
  • Detection of defects
  • Particle analyses
  • Energy-dispersive micro-area analysis
  • 3D display
  • Colour coding of details