Scanning Electron Microscopy (SEM)

The scanning electron microscope is used to perform fractographic, topographic and analytical examinations. The images are displayed simultaneously via the secondary electron (SE) and back-scattered electron (BSE) detectors. We use energy-dispersive micro-area analysis (EDX) for the qualitative and semi-quantitative detection of the elementary composition of the materials to be examined, including phases, foreign matter and non-metallic inclusions (NME). The results are displayed in graphs and tables or as spatially resolved images using the mapping function.
 

• Detection of microscopic fracture characteristics
• Microstructure analyses
• Determination of fracture origin areas
• Fracture propagation analyses
• Detection of fracture parameters
• Detection of foreign phases (inclusions, impurities)
• Detection of defects
• Particle analyses
• Energy-dispersive micro-area analysis
• 3D display
• Colour coding of details