Zeiss Merlin Gemini Scanning Electron Microscope

用于材料试验和失效分析
在500,000:1的放大倍数下对断面进行测绘图像分析研究

Zeiss Merlin Gemini Scanning Electron Microscope

用于材料试验和失效分析
在500,000:1的放大倍数下对断面进行测绘图像分析研究

Zeiss Merlin Gemini Scanning Electron Microscope

The high-resolution field emission scanning electron microscope and an energy dispersive X-ray microarea analysis (EDX) are used to run topography and morphology tests.

A field emitter gives magnifications of up to 500.000 : 1, which corresponds to a resolution of 0.6 nanometres on a sample surface. In addition, very low acceleration voltages can be selected, which permits testing of non-conductive materials like biological samples, plastics or ceramics.

Using four detectors, tests and analyses are performed at acceleration voltages of 0.1 kV to 30 kV in secondary and backscattered electron contrasts.

Application range

 

  • Fractography
  • Particle analyses
  • Topography examinations
  • Qualitative and semi-quantitative determination of materials (EDX)
  • Tests on grinding probes
  • Asbestos examinations

The tests are provided on a cross-sector and cross-material basis for semi-finished products, samples, components, and metallic and organic materials.

IABG 探伤事业部 专线

  • 固定电话:: +49 89 6088-2441
  • 移动电话:+49 151 6131 3167
  • 电子邮件: schadensanalyse@iabg.de

针对材料试验和失效分析的试验方法

为了对整体系统,零部件,原材料以及失效部位进行特征分析,我们运用了以下试验方法: